Effect of the Crystal Structure on the Piezoelectricity of [001]-Textured (Na, K)(Nb, Sb)O3-SrZrO3-(Bi, Ag)ZrO3 Lead-Free Piezoelectric Thick Film

An amount of 3.0 mol% NaNbO3 seeds was used to align the grains 0.96(Na0.5K0.5)(Nb0.93Sb0.07)O3-(0.04−x)SrZrO3-x(Bi0.5Ag0.5)ZrO3 [NKNS-(0.04−x)SZ-xBAZ] thick films (0.0 ≤ x 0.04) along [001] direction. All textured had large Lotgering factors (>95%). The NKNS-0.02SZ-0.02BAZ film has a rhombohedral-orthorhombic-tetragonal (R-O-T) structure with proportion R-O (>80%) and nanodomains (0.7 nm in width 6 length). This exhibited d33 value (760 ± 20 pC/N), kp (0.58) strain (0.16% at 4.0 kV/mm), good temperature stability fatigue properties. high piezoelectricity this can be attributed its degree texturing, optimized domain configuration, presence nanodomains. piezoelectric ceramic d15/d33 showed after texturing because easy rotation spontaneous polarizations. Hence, select ceramics values texturing.